FISCHERSCOPE® X-RAY XDV®-µ LD
performance thanks to DPP+
smallest spot size
largest measurement distance - best in class!
¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.
Performance at its best.
The highlight for complex shaped small test parts. The unparalleled measuring distance combined with the smallest measuring spot and microfokus tube Ultra for higher performance with smallest measuring sports make the FISCHERSCOPE® X-RAY XDV®-μ LD the industry-leading XRF instrument.
Meeting all challenges.
Reliable and fast results for ambitious measurement
Most advanced polycapillary optics on the market.
Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times
Accurate and precise.
Positioning of the measuring point on small structures thanks to automatic image recognition
Fully automatable.
Let your instrument work for you with just one click
DPP+ digital pulse processor.
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Real-time transmission, evaluation and export of measurement data with WinFTM®, the most powerful application software on the market.
With the microfocus tube Ultra, the excitation intensity is significantly increased. This ensures even better measuring performance with smallest measuring spots.
High-precision, programmable XY table with ≤ 2 µm approach accuracy and hood with C-slot for the most accurate probe positioning and automatic pattern recognition.
The high-performance silicon drift detector allows you to measure the smallest structures and thinnest layers < 0.1 µm precisely and non-destructive.
The long-distance polycapillary optics allow smallest measuring spots and exact measurements on assembled PCBs, connectors or pins at a unique measuring distance of 12 mm.
Features
Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots with µ-XRF; Molybdenum anode optional
Changeable filter
Higher count rates and significantly reduced measurement times thanks to DPP+
Polycapillary optics allow particularly small measuring spots with short measuring times with high intensity
Measuring spot approx.: Ø 60 µm
Determination of metal content in electroplating baths with corresponding accessories
Silicon drift detector with 20 or 50 mm² active area for highest precision with thin layers
Up to 135 mm possible height of samples
Application examples
- Measuring on smallest components and structures like assembled and complex shaped PCBs, plug contacts, bonding areas, SMD components or thin wires
- Measuring of functional layers in the electronics and semiconductor industry
- Determination of complex multilayer systems
- Automated measuring, such as in quality control
Do you have further applications? Then contact us!
Application Notes
Product videos
Tutorials
Webinars
Brochures
Application Notes
Product videos
FISCHERSCOPE® X-RAY XDV® series: Up to 50% improved performanceTutorials
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instrumentsFISCHERSCOPE® X-RAY tutorial: Stability testFISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®Webinars
Setting up measurement equipment monitoringSmaller, faster and more precise: Polycapillary optics for challenging applicationsReport documentationBrochures
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